Dear Customer,
Agilent cordially invites you to participate in a seminar “Overcoming RF Design and Testing Challenges” on September 21, 2011.
| Date: | September 21, 2011 (Wednesday) |
| Time: | 9:00am – 4:00pm |
| Venue: | High Function Room, 1/F, HKPC Building, 78 Tat
Chee Avenue, Kowloon, Hong Kong |
| Language: | Cantonese / English |
| Application: | Online registration |
Electrical or electronic equipment that uses the public power grid or has potential for electromagnetic emissions must pass EMC (electromagnetic compatibility) requirements. Today, more and more RF devices are being produced and they pose specific problems related to EMC compliance - not just in the design but also in isolating the problems, debugging, redesigning and retesting the RF devices to meet EMC compliance.
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This seminar will discuss challenges related to RF design and Testing and topics include:
| Seminar Topics |
| Paper 1: | Designing for EMC Compliance of PCBs – presented by Lexiwave Technology (Hong Kong) Limited |
| Paper 2: | Testing for EMC Pre-compliance of RF devices – presented by Agilent Technologies |
| Paper 3: | Overcoming RF Testing Challenges using Spectrum Analyzers - presented by Agilent Technologies |
| Paper 4: | Design and Testing of RFID devices – presented by Convergence System Limited |
| Paper 5: | Introduction to Latest EMC Requirements of IT equipment (CISPR 22) – presented by Hong Kong Productivity Council |
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For more details, please visit www.agilent.com.hk/find/RFseminar
Enquiry: Ms Nancy Cheung: 2788 5734, nancycheung@hkpc.org
Register now for this free seminar. Don't miss the chance to interact live with our experts!
Sincerely,
Agilent Technologies
Organizer:
